Gypsum : an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy.

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MetadadosDescriçãoIdioma
Autor(es): dc.creatorBarboza, Ana Paula Moreira-
Autor(es): dc.creatorSantos, Joyce Cristina da Cruz-
Autor(es): dc.creatorPinto, Elisângela Silva-
Autor(es): dc.creatorNeves, Bernardo Ruegger Almeida-
Data de aceite: dc.date.accessioned2025-08-21T15:33:28Z-
Data de disponibilização: dc.date.available2025-08-21T15:33:28Z-
Data de envio: dc.date.issued2020-08-13-
Data de envio: dc.date.issued2020-08-13-
Data de envio: dc.date.issued2019-
Fonte completa do material: dc.identifierhttp://www.repositorio.ufop.br/handle/123456789/12586-
Fonte completa do material: dc.identifierhttps://iopscience.iop.org/article/10.1088/1361-6528/ab5ded-
Fonte completa do material: dc.identifierhttps://doi.org/10.1088/1361-6528/ab5ded-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/capes/1018255-
Descrição: dc.descriptionGypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world.-
Formato: dc.formatapplication/pdf-
Idioma: dc.languageen-
Direitos: dc.rightsrestrito-
Título: dc.titleGypsum : an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy.-
Aparece nas coleções:Repositório Institucional - UFOP

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