Effect of interface traps on the different conduction mechanisms of MISHEMT from 200 K to 450 K

Registro completo de metadados
MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade de São Paulo (USP)-
Autor(es): dc.contributorUniversidade Estadual Paulista (UNESP)-
Autor(es): dc.creatorPerina, Welder F.-
Autor(es): dc.creatorMartino, Joao A.-
Autor(es): dc.creatorAgopian, Paula G. D.-
Data de aceite: dc.date.accessioned2025-08-21T17:24:03Z-
Data de disponibilização: dc.date.available2025-08-21T17:24:03Z-
Data de envio: dc.date.issued2025-04-29-
Data de envio: dc.date.issued2023-12-31-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1109/SBMicro64348.2024.10673872-
Fonte completa do material: dc.identifierhttps://hdl.handle.net/11449/305416-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/305416-
Descrição: dc.descriptionIn this work, the effect of the interface traps on the different conduction mechanisms of a Metal Insulator Semiconductor High Electron Mobility Transistor (MISHEMT) operating in multiple temperatures (from 200 K to 450 K) is evaluated through High Electron Mobility Transistor (HEMT) and Metal Insulator Semiconductor Field Effect Transistor (MISFET) numerical simulations. The interface traps of the MISFET poses barely any effect on the threshold voltage. For the HEMT, however, the behavior with traps enabled is basically the opposite when the traps are disabled. Combining the opposite behaviors of the threshold voltage curves of the MISFET and HEMT as a function of temperature, gives a possible explanation of the threshold voltage rebound effect observed in MISHEMT.-
Descrição: dc.descriptionUniversity of Sao Paulo LSI/PSI/USP-
Descrição: dc.descriptionSao Paulo States University Unesp-
Descrição: dc.descriptionSao Paulo States University Unesp-
Idioma: dc.languageen-
Relação: dc.relationSBMicro 2024 - 38th Symposium on Microelectronics Technology and Devices, Proceedings-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectGaN-
Palavras-chave: dc.subjectMISHEMT-
Palavras-chave: dc.subjectmultiple conductions-
Palavras-chave: dc.subjecttemperature-
Palavras-chave: dc.subjectthreshold voltage-
Título: dc.titleEffect of interface traps on the different conduction mechanisms of MISHEMT from 200 K to 450 K-
Tipo de arquivo: dc.typeaula digital-
Aparece nas coleções:Repositório Institucional - Unesp

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