An Atomic Force Microscopy (AFM) Modelling in Fractional Order: Nonlinear Control System Design

Registro completo de metadados
MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade Estadual Paulista (UNESP)-
Autor(es): dc.contributorFederal University of Technology Paraná-
Autor(es): dc.creatorYamaguchi, Patricia S.-
Autor(es): dc.creatorTusset, Angelo M.-
Autor(es): dc.creatorRibeiro, Mauricio A.-
Autor(es): dc.creatorBalthazar, Jose M.-
Data de aceite: dc.date.accessioned2025-08-21T15:49:42Z-
Data de disponibilização: dc.date.available2025-08-21T15:49:42Z-
Data de envio: dc.date.issued2023-03-01-
Data de envio: dc.date.issued2023-03-01-
Data de envio: dc.date.issued2022-10-01-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1007/s13538-022-01155-y-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/240357-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/240357-
Descrição: dc.descriptionThe atomic force microscope (AFM) on the nanoscale measurements comes from nanotechnology and is currently a multidisciplinary field of research. The present research proposal aims to contribute to scientific research on AFM considering that the system is operating in the intermittent mode and the contact of the tip with sample generates a damping represented by squeeze-film damping, and that the damping dynamics of the squeeze-film damping can be represented by fractional calculus through numerical simulation and dynamic analysis to prove chaotic regimes. To suppress chaotic behavior, we will use and analyze two control strategies, the SDRE (Riccati Equation Dependent States) and OLFC (Linear Control for Optimum Feedback) controls.-
Descrição: dc.descriptionUNESP São Paulo State University, SP-
Descrição: dc.descriptionUTFPR Federal University of Technology Paraná-
Descrição: dc.descriptionUNESP São Paulo State University, SP-
Idioma: dc.languageen-
Relação: dc.relationBrazilian Journal of Physics-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectAFM-
Palavras-chave: dc.subjectChaos-
Palavras-chave: dc.subjectDerivative fractional order-
Palavras-chave: dc.subjectOptimal linear control-
Palavras-chave: dc.subjectSDRE control-
Título: dc.titleAn Atomic Force Microscopy (AFM) Modelling in Fractional Order: Nonlinear Control System Design-
Tipo de arquivo: dc.typelivro digital-
Aparece nas coleções:Repositório Institucional - Unesp

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