Atomic Force Microscopy: A Powerful Tool for Electrical Characterization

Registro completo de metadados
MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade Estadual Paulista (UNESP)-
Autor(es): dc.contributorUniversidade Federal de São Carlos (UFSCar)-
Autor(es): dc.creatorTararam, Ronald-
Autor(es): dc.creatorGarcia, Pâmela S.-
Autor(es): dc.creatorDeda, Daiana K.-
Autor(es): dc.creatorVarela, José A.-
Autor(es): dc.creatorde Lima Leite, Fábio-
Data de aceite: dc.date.accessioned2025-08-21T19:52:45Z-
Data de disponibilização: dc.date.available2025-08-21T19:52:45Z-
Data de envio: dc.date.issued2022-04-30-
Data de envio: dc.date.issued2022-04-30-
Data de envio: dc.date.issued2017-03-23-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/232701-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/232701-
Descrição: dc.descriptionThe fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).-
Descrição: dc.descriptionMultidisciplinary Center for the Development of Ceramic Materials São Paulo State University-
Descrição: dc.descriptionFederal University of São Carlos-
Descrição: dc.descriptionMultidisciplinary Center for the Development of Ceramic Materials São Paulo State University-
Formato: dc.format37-64-
Idioma: dc.languageen-
Relação: dc.relationNanocharacterization Techniques-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectAtomic force microscopy-
Palavras-chave: dc.subjectElectrostatic force microscopy (EFM)-
Palavras-chave: dc.subjectIntermittent contact-
Palavras-chave: dc.subjectNanocharacterization-
Palavras-chave: dc.subjectSpatial resolution-
Palavras-chave: dc.subjectTopographical image-
Título: dc.titleAtomic Force Microscopy: A Powerful Tool for Electrical Characterization-
Tipo de arquivo: dc.typelivro digital-
Aparece nas coleções:Repositório Institucional - Unesp

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