Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate

Registro completo de metadados
MetadadosDescriçãoIdioma
Autor(es): dc.contributorNational Institute for Space Research (INPE)-
Autor(es): dc.contributorUniversidade Estadual Paulista (UNESP)-
Autor(es): dc.creatorVieira, R. A.-
Autor(es): dc.creatorNono, M. C.A.-
Autor(es): dc.creatorCruz, N. C.-
Data de aceite: dc.date.accessioned2025-08-21T21:36:28Z-
Data de disponibilização: dc.date.available2025-08-21T21:36:28Z-
Data de envio: dc.date.issued2022-04-28-
Data de envio: dc.date.issued2022-04-28-
Data de envio: dc.date.issued2002-08-15-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1002/1521-3951(200207)232:1<116-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/224251-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/224251-
Descrição: dc.descriptionThe results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The diluted interface was obtained by thermal activated atomic diffusion. The Ti film and Ti film-304 SS interface were analyzed by energy dispersive spectrometry and were observed using atomic force microscopy. The nanohardness of the Ti film-304 SS system was measured by a nanoindentation technique. The results showed the Ti film-304 SS interface had a higher hardness value than the Ti film and 304 SS substrate. The Ti film surface had a lower hardness due to the presence of a TiO2 thin layer.-
Descrição: dc.descriptionAssociated Laboratory for Sensors and Materials (LAS) National Institute for Space Research (INPE), Sao Jose dos Campos, SP-
Descrição: dc.descriptionPhysics and Chemistry Department (DFQ) FEG-UNESP, Guaratinguetá, SP-
Descrição: dc.descriptionPhysics and Chemistry Department (DFQ) FEG-UNESP, Guaratinguetá, SP-
Formato: dc.format116-120-
Idioma: dc.languageen-
Relação: dc.relationPhysica Status Solidi (B) Basic Research-
???dc.source???: dc.sourceScopus-
Título: dc.titleNanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate-
Tipo de arquivo: dc.typeaula digital-
Aparece nas coleções:Repositório Institucional - Unesp

Não existem arquivos associados a este item.