Optical Phase Detection Method for Measurements and Calibration of Pockels Cell-Based Sensors

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Autor(es): dc.contributorUniversidade Estadual Paulista (Unesp)-
Autor(es): dc.contributorFed Inst Mato Grosso Sul-
Autor(es): dc.creatorFernandes Tobal, Flavio Henrique [UNESP]-
Autor(es): dc.creatorGaleti, Jose Henrique-
Autor(es): dc.creatorFelao, Luiz Henrique Vitti [UNESP]-
Autor(es): dc.creatorHiguti, Ricardo Tokio [UNESP]-
Autor(es): dc.creatorKitano, Claudio [UNESP]-
Data de aceite: dc.date.accessioned2022-02-22T00:57:13Z-
Data de disponibilização: dc.date.available2022-02-22T00:57:13Z-
Data de envio: dc.date.issued2021-06-25-
Data de envio: dc.date.issued2021-06-25-
Data de envio: dc.date.issued2020-11-30-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1109/TIM.2020.3004684-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/209651-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/209651-
Descrição: dc.descriptionNowadays, the most successful optical technique developed for measuring high voltages in 50-/60-Hz electric power lines utilizes the bulk lithium niobate Pockels cell, constituting the so-called optical voltage sensor (OVS). However, unlike the area of vibrometry, where there are ISO standards based on reliable and simple interferometric methods for calibrating the sensors, there is still no standardized procedure for measuring V-pi (half-wave voltage) of Pockels cells or for calibrating OVSs. As the Pockels cell-based OVSs can be considered as a polarimetric interferometer, and inspired by the ISO 16063-41 standard (for the calibration of vibration and shock transducers), specifically the technique called signal coincidence method (SCM), this work presents a new digital and real-time method for optical phase detection tailored for the measurement of V-pi in OVSs. Measurements were made in order to demonstrate the effectiveness of the new technique by applying a voltage signal to the OVS, composed by the superposition of a 60-Hz sinusoidal voltage, with amplitude equal to the reference value of V-pi (4.068 kV in this case) and a dc voltage high enough to provide a 90 degrees bias static phase shift, as specified by SCM, proving that the method can recover the value of V-pi in accordance with the estimated value. However, it is well known that the adjustment of the bias phase in a polarimetric interferometer can undergo undesired variations from time to time, due to drifts in ambient temperature and other external disturbances, taking the OVS out of its optimal operating point and thus not attending the ISO standard. As an advantage, experiments have shown that the new method is tolerant to variations in the 90 degrees bias static phase (ranging from 60 degrees to 120 degrees), as well as to variations in the amplitude of the voltage applied to the OVS, varying +/- 25% in relation to the 4.068-kV reference voltage. The V-pi values were accurately detected, with a maximum percentage error of 0.2% and, therefore, satisfying the specification of the ISO 16063 standard.-
Descrição: dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)-
Descrição: dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
Descrição: dc.descriptionSao Paulo State Univ, Dept Elect Engn, BR-15385000 Ilha Solteira, SP, Brazil-
Descrição: dc.descriptionFed Inst Mato Grosso Sul, BR-79641162 Tres Lagoas, Brazil-
Descrição: dc.descriptionSao Paulo State Univ, Dept Elect Engn, BR-15385000 Ilha Solteira, SP, Brazil-
Descrição: dc.descriptionCAPES: 001-
Descrição: dc.descriptionCNPq: 420673/2016-
Descrição: dc.descriptionCNPq: 305546/2017-
Formato: dc.format9822-9832-
Idioma: dc.languageen-
Publicador: dc.publisherIeee-inst Electrical Electronics Engineers Inc-
Relação: dc.relationIeee Transactions On Instrumentation And Measurement-
???dc.source???: dc.sourceWeb of Science-
Palavras-chave: dc.subjectHigh-voltage sensor-
Palavras-chave: dc.subjectinstrumentation-
Palavras-chave: dc.subjectinterferometry-
Palavras-chave: dc.subjectmeasurement-
Palavras-chave: dc.subjectmetrology-
Palavras-chave: dc.subjectoptoelectronics-
Palavras-chave: dc.subjectphase measurement-
Palavras-chave: dc.subjectPockels cell-
Palavras-chave: dc.subjectPockels effect-
Título: dc.titleOptical Phase Detection Method for Measurements and Calibration of Pockels Cell-Based Sensors-
Tipo de arquivo: dc.typelivro digital-
Aparece nas coleções:Repositório Institucional - Unesp

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