Short-time kinetics of photorefractive gratings recorded under active phase control: an experimental method to materials characterization

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MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade Federal do ABC (UFABC)-
Autor(es): dc.contributorUniversidade Estadual Paulista (Unesp)-
Autor(es): dc.creatorFreschi, A. A.-
Autor(es): dc.creatorDe Vicente, F. S. [UNESP]-
Data de aceite: dc.date.accessioned2022-02-22T00:28:27Z-
Data de disponibilização: dc.date.available2022-02-22T00:28:27Z-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2019-12-31-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1007/s00340-019-7364-z-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/199830-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/199830-
Descrição: dc.descriptionThe initial speed of photorefractive recording and erasure is investigated in two-wave mixing experiments under carefully controlled grating phase shifts. Results are reported for the full 2π range of possible phase shifts between the refractive-index grating and the projected interference pattern. The technique is especially suited for experiments using continuous light illumination at low light fringe modulations, providing easy measurement of the grating diffraction efficiency in absolute values. Measurements of the short-time kinetics of the space charge field are carried out for a Bi12TiO20 crystal subjected to different charge transport mechanisms (diffusion and drift by an external electric field). A simple rate equation obtained by the Kukhtarev’s theory is used to fit the experimental data, from which important photorefractive parameters such as the dielectric relaxation time and the effective mobility-lifetime product of the photoexcited charge carriers are determined. Additionally, the reduction factor of the electric field due to screening charges can be known in cases where an external field is applied.-
Descrição: dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
Descrição: dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
Descrição: dc.descriptionCentro de Engenharia (CECS) Universidade Federal do ABC (UFABC), Avenida dos Estados 5001-
Descrição: dc.descriptionDepartamento de Física Instituto de Geociências e Ciências Exatas Universidade Estadual Paulista (UNESP)-
Descrição: dc.descriptionDepartamento de Física Instituto de Geociências e Ciências Exatas Universidade Estadual Paulista (UNESP)-
Idioma: dc.languageen-
Relação: dc.relationApplied Physics B: Lasers and Optics-
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Título: dc.titleShort-time kinetics of photorefractive gratings recorded under active phase control: an experimental method to materials characterization-
Tipo de arquivo: dc.typelivro digital-
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