Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis

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MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade Estadual Paulista (Unesp)-
Autor(es): dc.contributorSchool of Engineering-PPGEMN-
Autor(es): dc.contributorTechnical Institute Aerospace (ITA)-
Autor(es): dc.contributorUnP - Laureate University-
Autor(es): dc.creatorSilva, Alecsandro de Moura [UNESP]-
Autor(es): dc.creatorFigueiredo, Viviane Maria Gonçalves de [UNESP]-
Autor(es): dc.creatorMassi, Marcos-
Autor(es): dc.creatorPrado, Renata Falchete do [UNESP]-
Autor(es): dc.creatorSilva Sobrinho, Argemiro Soares da-
Autor(es): dc.creatorQueiroz, José Reinaldo Cavalcanti de-
Autor(es): dc.creatorNogueira Junior, Lafayette [UNESP]-
Data de aceite: dc.date.accessioned2022-02-22T00:28:12Z-
Data de disponibilização: dc.date.available2022-02-22T00:28:12Z-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2019-10-31-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1111/jicd.12477-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/199740-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/199740-
Descrição: dc.descriptionAIM: To analyze the effect of a silicon (Si)-based film deposited on yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) on the topography and bond strength of resin cement. METHODS: Specimens of zirconia were obtained and randomly divided into 4 groups, according to surface treatment: polished group (PG) zirconia; sandblasted group (SG) zirconia with aluminum oxide (100 µm); after polished, zirconia was coated with Si-based film group (SiFG); and after sandblasted, zirconia was coated with Si-based film group (SiFSG). The Si-based films were obtained through plasma-enhanced chemical vapor deposition. Surface roughness and contact angle analysis were performed. Resin cement cylinders were built up on the treated surface of blocks, after applying Monobond-S. The specimens were submitted to thermocycling aging and shear bond strength testing. The Kruskal-Wallis and Mann-Whitney U-tests were performed. RESULTS: There were significant differences between the surface treatments for each roughness parameter measured. Si-based film increased roughness and decreased the contact angle. Si-based film groups also demonstrated significantly lower bond strength values. CONCLUSION: Si-based film produced using plasma deposition provided lower bond strength to resin cement compared with conventional treatment; however, the film deposition reduced the contact angle and improved roughness, favorable properties in the long way to prepare an optimum material.-
Descrição: dc.descriptionDepartment of Dental Materials and Prosthodontics Institute of Science and Technology of Sao Jose dos Campos São Paulo State University (UNESP)-
Descrição: dc.descriptionMackenzie Presbyterian University School of Engineering-PPGEMN-
Descrição: dc.descriptionDepartment of Physic Technical Institute Aerospace (ITA)-
Descrição: dc.descriptionDepartment of Biotechnology UnP - Laureate University-
Descrição: dc.descriptionDepartment of Dental Materials and Prosthodontics Institute of Science and Technology of Sao Jose dos Campos São Paulo State University (UNESP)-
Formato: dc.formate12477-
Idioma: dc.languageen-
Relação: dc.relationJournal of investigative and clinical dentistry-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectadhesion-
Palavras-chave: dc.subjectplasma-enhanced chemical vapor deposition-
Palavras-chave: dc.subjectroughness-
Palavras-chave: dc.subjectshear bond strength-
Palavras-chave: dc.subjectzirconia-
Título: dc.titleSilicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis-
Tipo de arquivo: dc.typelivro digital-
Aparece nas coleções:Repositório Institucional - Unesp

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