Piezoelectric properties of Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 thin films studied by in situ X-ray diffraction

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Autor(es): dc.contributorCEDEX 20-
Autor(es): dc.contributorL'Orme des Merisiers-
Autor(es): dc.contributorUniversity of Rio Verde (UniRV)-
Autor(es): dc.contributorUniversidade Estadual Paulista (Unesp)-
Autor(es): dc.contributorUniversity of Aveiro-
Autor(es): dc.contributorNational University of Science and Technology MISiS-
Autor(es): dc.creatorCornelius, Thomas W.-
Autor(es): dc.creatorMocuta, Cristian-
Autor(es): dc.creatorEscoubas, Stéphanie-
Autor(es): dc.creatorLima, Luiz R.M. [UNESP]-
Autor(es): dc.creatorAraújo, Eudes B. [UNESP]-
Autor(es): dc.creatorKholkin, Andrei L.-
Autor(es): dc.creatorThomas, Olivier-
Data de aceite: dc.date.accessioned2022-02-22T00:26:57Z-
Data de disponibilização: dc.date.available2022-02-22T00:26:57Z-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2020-08-01-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.3390/ma13153338-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/199284-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/199284-
Descrição: dc.descriptionThe piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.-
Descrição: dc.descriptionMinistry of Education and Science of the Russian Federation-
Descrição: dc.descriptionFederación Española de Enfermedades Raras-
Descrição: dc.descriptionAix Marseille Univ Univ Toulon CNRS IM2NP CEDEX 20-
Descrição: dc.descriptionSynchrotron SOLEIL L'Orme des Merisiers, Saint-Aubin-BP 48-
Descrição: dc.descriptionFaculty of Mechanical Engineering University of Rio Verde (UniRV)-
Descrição: dc.descriptionSchool of Natural Sciences and Engineering Department of Physics and Chemistry São Paulo State University (UNESP)-
Descrição: dc.descriptionDepartment of Physics and CICECO-Aveiro Institute of Materials University of Aveiro-
Descrição: dc.descriptionLaboratory of Functional Low-Dimensional Structures National University of Science and Technology MISiS-
Descrição: dc.descriptionSchool of Natural Sciences and Engineering Department of Physics and Chemistry São Paulo State University (UNESP)-
Descrição: dc.descriptionMinistry of Education and Science of the Russian Federation: K2-2019-015-
Descrição: dc.descriptionFederación Española de Enfermedades Raras: PT2020-
Idioma: dc.languageen-
Relação: dc.relationMaterials-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectLanthanum-modified lead zirconate titanate (PLZT)-
Palavras-chave: dc.subjectPiezoelectric properties-
Palavras-chave: dc.subjectX-ray diffraction-
Título: dc.titlePiezoelectric properties of Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 thin films studied by in situ X-ray diffraction-
Tipo de arquivo: dc.typelivro digital-
Aparece nas coleções:Repositório Institucional - Unesp

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