Analysis and measurement of the non-linear refractive index of SiOx Ny using pedestal waveguides

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MetadadosDescriçãoIdioma
Autor(es): dc.contributorUniversidade de São Paulo (USP)-
Autor(es): dc.contributorUniversidade Estadual Paulista (Unesp)-
Autor(es): dc.contributorIPEN-CNEN/SP-
Autor(es): dc.contributorSão Paulo State Technological College (FATEC)-
Autor(es): dc.creatorSierra, Julian H.-
Autor(es): dc.creatorCarvalho, Daniel O. [UNESP]-
Autor(es): dc.creatorSamad, Ricardo E.-
Autor(es): dc.creatorRangel, Ricardo C.-
Autor(es): dc.creatorAlayo, Marco I.-
Data de aceite: dc.date.accessioned2022-02-22T00:24:17Z-
Data de disponibilização: dc.date.available2022-02-22T00:24:17Z-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2020-12-11-
Data de envio: dc.date.issued2019-08-01-
Fonte completa do material: dc.identifierhttp://dx.doi.org/10.1109/SBMicro.2019.8919392-
Fonte completa do material: dc.identifierhttp://hdl.handle.net/11449/198340-
Fonte: dc.identifier.urihttp://educapes.capes.gov.br/handle/11449/198340-
Descrição: dc.descriptionIn this work, the non-linear refractive index (n2) of silicon oxynitride (SiOx Ny) is determined, obtaining a value for this material of n2 = 2.11×10-19 m2/W. The results demonstrate that this material has interesting properties for the development of non-linear optical devices. The paper presents in detail the waveguide fabrication process using the pedestal technique, which allows using different materials since it does not require etching to define the sidewalls of the waveguides. We show the results of the measurement of the n2 employing the non-linear optical phenomena of Self-Phase Modulation (SPM).-
Descrição: dc.descriptionUniversity of São Paulo Polytechnic School-
Descrição: dc.descriptionSão Paulo State University (UNESP) São João de Boa Vista Telecommunications Department-
Descrição: dc.descriptionCenter for Lasers and Applications IPEN-CNEN/SP-
Descrição: dc.descriptionSão Paulo State Technological College (FATEC)-
Descrição: dc.descriptionSão Paulo State University (UNESP) São João de Boa Vista Telecommunications Department-
Idioma: dc.languageen-
Relação: dc.relationSBMicro 2019 - 34th Symposium on Microelectronics Technology and Devices-
???dc.source???: dc.sourceScopus-
Palavras-chave: dc.subjectintegrated photonics-
Palavras-chave: dc.subjectmicroelectronics-
Palavras-chave: dc.subjectnon-linear photonics-
Palavras-chave: dc.subjectnon-linear refractive index-
Palavras-chave: dc.subjectoptical devices-
Palavras-chave: dc.subjectself-phase modulation-
Palavras-chave: dc.subjectsilicon oxynitride-
Título: dc.titleAnalysis and measurement of the non-linear refractive index of SiOx Ny using pedestal waveguides-
Aparece nas coleções:Repositório Institucional - Unesp

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