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Bias and Temperature Stress Effects in IGZO TFTs and the Application of Step-Stress Testing to Increase Reliability Test Throughput
James Watt School of Engineering; School of Computer Science and Electronic Engineering; Universidade Estadual Paulista (UNESP); Bangor College; Shandon Diagnostics Ltd
Mohammadian, Navid; Kumar, Dinesh; Fugikawa-Santos, Lucas; Leonardo Nogueira, Gabriel; Zhang, Shouzhou; Alves, Neri; Ballantine, David; Kettle, Jeff
29-Abr-2025
★★★★★ (0)
Bias and Temperature Stress Effects in IGZO TFTs and the Application of Step-Stress Testing to Increase Reliability Test Throughput
James Watt School of Engineering; School of Computer Science and Electronic Engineering; Universidade Estadual Paulista (UNESP); Bangor College; Shandon Diagnostics Ltd
Mohammadian, Navid; Kumar, Dinesh; Fugikawa-Santos, Lucas; Leonardo Nogueira, Gabriel; Zhang, Shouzhou; Alves, Neri; Ballantine, David; Kettle, Jeff
29-Abr-2025
★★★★★ (0)

Mostrando resultados 1 a 2 de 2